SCANNING ELECTRON-MICROSCOPY WITH POLARIZATION ANALYSIS (SEMPA) - STUDIES OF DOMAINS, DOMAIN-WALLS AND MAGNETIC SINGULARITIES AT SURFACES AND IN THIN-FILMS

被引:5
作者
SCHEINFEIN, MR
UNGURIS, J
AESCHLIMANN, M
PIERCE, DT
CELOTTA, RJ
机构
[1] National Institute of Standards and Technology, Gaithersburg
关键词
D O I
10.1016/0304-8853(91)90313-Y
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Scanning Electron Microscopy with Polarization Analysis (SEMPA) is used to investigate the surface magnetic microstructure of domain walls in thin permalloy films and the domain structure of magneto-optic TbFeCo alloys. Domain wall measurements confirm the results of micromagnetic theory.
引用
收藏
页码:109 / 115
页数:7
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