SCANNING ELECTRON-MICROSCOPY WITH POLARIZATION ANALYSIS (SEMPA) - STUDIES OF DOMAINS, DOMAIN-WALLS AND MAGNETIC SINGULARITIES AT SURFACES AND IN THIN-FILMS

被引：5

作者：

SCHEINFEIN, MR

UNGURIS, J

AESCHLIMANN, M

PIERCE, DT

CELOTTA, RJ

机构：

[1] National Institute of Standards and Technology, Gaithersburg

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1991年 / 93卷

关键词：

D O I：

10.1016/0304-8853(91)90313-Y

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Scanning Electron Microscopy with Polarization Analysis (SEMPA) is used to investigate the surface magnetic microstructure of domain walls in thin permalloy films and the domain structure of magneto-optic TbFeCo alloys. Domain wall measurements confirm the results of micromagnetic theory.

引用

页码：109 / 115

页数：7

共 32 条

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