THERMOREFLECTANCE INVESTIGATION OF HEAVILY DOPED SILICON

被引：3

作者：

BORGHESI, A ^{[1
]}

BOTTAZZI, P ^{[1
]}

GUIZZETTI, G ^{[1
]}

NOSENZO, L ^{[1
]}

STELLA, A ^{[1
]}

机构：

[1] CISM,GRP NAZL STRUTTURA MAT UNITA,PAVIA,ITALY

来源：

SOLID STATE COMMUNICATIONS | 1986年 / 60卷 / 10期

关键词：

D O I：

10.1016/0038-1098(86)90601-0

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：807 / 810

页数：4

共 15 条

[1]

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[6] OPTICAL-PROPERTIES OF TI1-XHFXSE2 LAYERED COMPOUNDS FROM 1 TO 9-EV [J].

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[7]

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[8]

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[10] THERMOREFLECTANCE SPECTRA OF DIAMOND AND ZINCBLENDE SEMICONDUCTORS IN VACUUM ULTRAVIOLET REGION [J].

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