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PIXE ANALYSIS WITH EXTERNAL BEAMS - SYSTEMS AND APPLICATIONS

被引：43
作者：
WILLIAMS, ET
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1984年 / 3卷 / 1-3期
关键词：
D O I：
10.1016/0168-583X(84)90365-3
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：211 / 219
页数：9
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