ELIMINATION OF RESIDUAL IMAGE DISTORTION IN THE STIGMATIC ION-MICROSCOPE

被引：4

作者：

BERNIUS, MT ^{[1
]}

LING, YC ^{[1
]}

MORRISON, GH ^{[1
]}

机构：

[1] CORNELL UNIV,BAKER LAB CHEM,ITHACA,NY 14853

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 61卷 / 05期

关键词：

D O I：

10.1063/1.338062

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1677 / 1681

页数：5

共 12 条

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[2] HIGH-RESOLUTION IMAGING WITH THE STIGMATIC ION-MICROSCOPE [J].

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LING, YC ;

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LING, YC ;

MORRISON, GH .

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[4]

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[5]

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[7]

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[8]

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[9] CORRELATIVE LIGHT, ELECTRON, AND ION MICROSCOPY ON A SINGLE HISTOLOGIC SECTION [J].

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[10]

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