EXTRAORDINARY ALIGNMENT OF NB-FILMS WITH SAPPHIRE AND THE EFFECTS OF ADDED HYDROGEN

被引：69

作者：

REIMER, PM ^{[1
]}

ZABEL, H ^{[1
]}

FLYNN, CP ^{[1
]}

DURA, JA ^{[1
]}

机构：

[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801

来源：

PHYSICAL REVIEW B | 1992年 / 45卷 / 19期

关键词：

D O I：

10.1103/PhysRevB.45.11426

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present the results of high-resolution x-ray scattering studies of the structural coherence of niobium [110] films grown by molecular-beam epitaxy on sapphire [1120BAR] substrates. In transverse scans of the out-of-plane (110) Bragg peak we find two components, the sharper of which implies mosaicities an order of magnitude better than bulk single-crystal Nb, and transverse structural coherence lengths exceeding 10(4) angstrom. In addition, we observe that the planes associated with the sharp component are exactly aligned with the sapphire (1120BAR) planes. Upon hydrogen loading of the Nb film, we find evidence for a dramatic increase of the lateral coherence length.

引用

页码：11426 / 11429

页数：4

共 15 条

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