OPTICAL-CONSTANTS DERIVATION FOR AN INHOMOGENEOUS THIN-FILM FROM INSITU TRANSMISSION MEASUREMENTS

[1] MULTIPLE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS [J]. APPLIED OPTICS, 1984, 23 (20): : 3571 - 3596

[2] INHOMOGENEITY IN FILMS - LIMITATION OF THE ACCURACY OF OPTICAL MONITORING OF THIN-FILMS [J]. APPLIED OPTICS, 1981, 20 (01): : 90 - 94

[3] Bozic S. M., 1979, DIGITAL KALMAN FILTE

[4] Jacobsson R., 1975, PHYS THIN FILMS, V8, P51

[5] Lee C.-C, 1983, MOISTURE ADSORPTION

[6] MACLEOD HA, 1982, P SOC PHOTO-OPT INST, V325, P21, DOI 10.1117/12.933282

[7] SIMPLE METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS N,K AND THICKNESS OF A WEAKLY ABSORBING THIN-FILM [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (11): : 1002 - 1004

[8] SCHMITT B, 1983, THESIS ECOLE NATIONA

[9] DETERMINATION OF THE THICKNESS AND OPTICAL-CONSTANTS OF AMORPHOUS-SILICON [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (12): : 1214 - 1222

[10] VANMILLIGEN F, 1984, J OPT SOC AM A, V1, P1258

[1] MULTIPLE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS [J]. APPLIED OPTICS, 1984, 23 (20): : 3571 - 3596

[2] INHOMOGENEITY IN FILMS - LIMITATION OF THE ACCURACY OF OPTICAL MONITORING OF THIN-FILMS [J]. APPLIED OPTICS, 1981, 20 (01): : 90 - 94

[3] Bozic S. M., 1979, DIGITAL KALMAN FILTE

[4] Jacobsson R., 1975, PHYS THIN FILMS, V8, P51

[5] Lee C.-C, 1983, MOISTURE ADSORPTION

[6] MACLEOD HA, 1982, P SOC PHOTO-OPT INST, V325, P21, DOI 10.1117/12.933282

[7] SIMPLE METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS N,K AND THICKNESS OF A WEAKLY ABSORBING THIN-FILM [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (11): : 1002 - 1004

[8] SCHMITT B, 1983, THESIS ECOLE NATIONA

[9] DETERMINATION OF THE THICKNESS AND OPTICAL-CONSTANTS OF AMORPHOUS-SILICON [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (12): : 1214 - 1222

[10] VANMILLIGEN F, 1984, J OPT SOC AM A, V1, P1258