STRONG CHARGE-STATE DEPENDENCE OF H+ AND H-2(+) SPUTTERING INDUCED BY SLOW HIGHLY-CHARGED IONS

被引：29

作者：

KAKUTANI, N ^{[1
]}

AZUMA, T ^{[1
]}

YAMAZAKI, Y ^{[1
]}

KOMAKI, K ^{[1
]}

KUROKI, K ^{[1
]}

机构：

[1] UNIV TOKYO, COLL ARTS & SCI, TOKYO, JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1995年 / 96卷 / 3-4期

关键词：

D O I：

10.1016/0168-583X(95)00240-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Secondary ion emission has been studied for very slow (similar to 0.01 nu(B)) highly charged Ar and N ions bombarding C-60 containing hydrogen as an impurity. It is found that the fragmentations of C-60 are very rare even for Ar16+ bombardments. On the other hand, the sputtering of H+ and H-2(+) has been observed to increase drastically as a function of incident charge q like q(gamma) (e.g., gamma similar to 4.6 for H+ sputtering by 500 eV Ar-q+).

引用

页码：541 / 544

页数：4

共 20 条

[1]

BARAGIOLA RA, 1991, NATO ADV SCI I B-PHY, V271, P313

[2]

Behrisch, 1983, SPUTTERING PARTICLE, V52

[3]

Behrisch R., 1981, SPUTTERING PARTICLE

[4]

Behrisch R., 1981, SPUTTERING PARTICLE, V1