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FREQUENCY-EFFECTS IN PLASMA-ETCHING
被引:73
作者
:
FLAMM, DL
论文数:
0
引用数:
0
h-index:
0
FLAMM, DL
机构
:
来源
:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
|
1986年
/ 4卷
/ 03期
关键词
:
D O I
:
10.1116/1.573821
中图分类号
:
TB3 [工程材料学];
学科分类号
:
0805 ;
080502 ;
摘要
:
引用
收藏
页码:729 / 738
页数:10
相关论文
共 52 条
[51]
TAGASHIRA H, 1985, 7TH P INT S PLASM CH, V4, P1337
[52]
COMPARISON OF MICROWAVE AND LOWER FREQUENCY PLASMAS FOR THIN-FILM DEPOSITION AND ETCHING
WERTHEIMER, MR
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE POLYTECH, DEPT ENGN PHYS, MONTREAL H3C 3A7, QUEBEC, CANADA
WERTHEIMER, MR
MOISAN, M
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE POLYTECH, DEPT ENGN PHYS, MONTREAL H3C 3A7, QUEBEC, CANADA
MOISAN, M
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A,
1985,
3
(06):
: 2643
-
2649
←
1
2
3
4
5
6
→
共 52 条
[51]
TAGASHIRA H, 1985, 7TH P INT S PLASM CH, V4, P1337
[52]
COMPARISON OF MICROWAVE AND LOWER FREQUENCY PLASMAS FOR THIN-FILM DEPOSITION AND ETCHING
WERTHEIMER, MR
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE POLYTECH, DEPT ENGN PHYS, MONTREAL H3C 3A7, QUEBEC, CANADA
WERTHEIMER, MR
MOISAN, M
论文数:
0
引用数:
0
h-index:
0
机构:
ECOLE POLYTECH, DEPT ENGN PHYS, MONTREAL H3C 3A7, QUEBEC, CANADA
MOISAN, M
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A,
1985,
3
(06):
: 2643
-
2649
←
1
2
3
4
5
6
→