THE EFFECTS OF FILAMENTARY CONDUCTION THROUGH UNIFORM AND FLAWED FILAMENTS IN INSULATORS AND SEMICONDUCTORS

被引:16
作者
GOULD, RD
机构
关键词
D O I
10.1016/0022-3093(83)90042-X
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:363 / 386
页数:24
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共 28 条
[1]   HOT ELECTRON TRANSPORT AND EMISSION IN AU-SIO-AU THIN FILM CATHODES [J].
COLLINS, RA ;
GOULD, RD .
SOLID-STATE ELECTRONICS, 1971, 14 (09) :805-&
[2]  
Coward L. A., 1971, Journal of Non-Crystalline Solids, V6, P107, DOI 10.1016/0022-3093(71)90049-4
[3]   Thermal Mechanism of the Switching Phenomenon [J].
Croitoru, N. ;
Popescu, C. .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1970, 3 (04) :1047-1055
[4]   ELECTRICAL PHENOMENA IN AMORPHOUS OXIDE FILMS [J].
DEARNALEY, G ;
STONEHAM, AM ;
MORGAN, DV .
REPORTS ON PROGRESS IN PHYSICS, 1970, 33 (11) :1129-+
[5]  
Dearnaley G., 1970, Journal of Non-Crystalline Solids, V4, P593, DOI 10.1016/0022-3093(70)90097-9
[6]   ON THE ORIGIN OF THE IR LIGHT EMITTED BY AL-SIO-AU AND AL-AL2O3-AU THIN-FILM STRUCTURES POLARIZED IN A VACUUM [J].
DELAUNAY, G ;
ROPARS, F ;
DESPUJOLS, J .
THIN SOLID FILMS, 1981, 76 (02) :149-156
[7]  
DOUCAS G, 1971, THIN SOLID FILMS, V9, P25
[8]   ELECTRICAL SWITCHING PHENOMENA IN TRANSITION METAL GLASSES UNDER INFLUENCE OF HIGH ELECTRIC FIELDS [J].
DRAKE, CF ;
SCANLAN, IF ;
ENGEL, A .
PHYSICA STATUS SOLIDI, 1969, 32 (01) :193-&
[9]   OBSERVATION OF FILAMENT FORMATION IN AMORPHOUS FILMS DURING SWITCHING [J].
FELDMAN, C ;
MOORJANI, K .
THIN SOLID FILMS, 1970, 5 (01) :R1-&
[10]   OBSERVATIONS OF CURRENT FILAMENTS IN CHROMIUM-DOPED GAAS [J].
FERRO, AP ;
GHANDHI, SK .
APPLIED PHYSICS LETTERS, 1970, 16 (05) :196-&