ON THE ORIGIN OF THE IR LIGHT EMITTED BY AL-SIO-AU AND AL-AL2O3-AU THIN-FILM STRUCTURES POLARIZED IN A VACUUM

被引:6
作者
DELAUNAY, G
ROPARS, F
DESPUJOLS, J
机构
关键词
D O I
10.1016/0040-6090(81)90246-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:149 / 156
页数:8
相关论文
共 12 条
[1]  
BRAMSON MA, 1968, INFRARED RAD, P538
[2]   ELECTRICAL PHENOMENA IN AMORPHOUS OXIDE FILMS [J].
DEARNALEY, G ;
STONEHAM, AM ;
MORGAN, DV .
REPORTS ON PROGRESS IN PHYSICS, 1970, 33 (11) :1129-+
[3]   ELECTROLUMINESCENCE OF AL-SIO-AU STRUCTURES IN THIN-FILMS [J].
DELAUNAY, G ;
DESPUJOLS, J .
THIN SOLID FILMS, 1978, 51 (02) :227-235
[4]   CURRENT-VOLTAGE CHARACTERISTICS, DIELECTRIC-BREAKDOWN AND POTENTIAL DISTRIBUTION MEASUREMENTS IN AU-SIOX-AU THIN-FILM DIODES AND TRIODES [J].
GOULD, RD ;
HOGARTH, CA .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1974, 37 (02) :157-175
[5]   RELATIONSHIP OF THE CURRENT-VOLTAGE CHARACTERISTICS TO THE DISTRIBUTION OF FILAMENT RESISTANCES IN ELECTROFORMED MIM STRUCTURES [J].
GOULD, RD .
THIN SOLID FILMS, 1979, 57 (01) :33-38
[6]  
Hansen M., 1958, J ELECTROCHEM SOC, DOI DOI 10.1149/1.2428700
[8]   MIGRATION OF GOLD ATOMS THROUGH THIN SILICON-OXIDE FILMS [J].
MADAMS, CJ ;
MORGAN, DV ;
HOWES, MJ .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (11) :5088-5090
[9]   MEMORY SWITCHING IN SIO FILMS WITH AG AND CO ELECTRODES [J].
MANHART, S .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (01) :82-86
[10]   ELECTRON-EMISSION MECHANISM IN MIM STRUCTURES AND ELECTRON PROPAGATION IN METALS [J].
NIQUET, G ;
FLAMION, PJ ;
VERNIER, P .
THIN SOLID FILMS, 1977, 44 (01) :103-108