ELECTRON-SPECTROSCOPY STUDY OF MO SI(111) INTERFACES

被引:9
作者
NGUYEN, TTA
CINTI, RC
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JOURNAL DE PHYSIQUE | 1984年 / 45卷 / NC-5期
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10.1051/jphyscol:1984565
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页码:435 / 439
页数:5
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共 13 条
[1]   DETERMINATION OF MONOLAYER COVERAGE BY AUGER-ELECTRON SPECTROSCOPY - APPLICATION TO CARBON ON PLATINUM [J].
BIBERIAN, JP ;
SOMORJAI, GA .
APPLIED SURFACE SCIENCE, 1979, 2 (03) :352-358
[2]   THE STRUCTURE AND PROPERTIES OF METAL-SEMICONDUCTOR INTERFACES [J].
Brillson, L. J. .
SURFACE SCIENCE REPORTS, 1982, 2 (02) :123-326
[3]   PHOTOEMISSION FROM SURFACE-ATOM CORE LEVELS, SURFACE DENSITIES OF STATES, AND METAL-ATOM CLUSTERS - A UNIFIED PICTURE [J].
CITRIN, PH ;
WERTHEIM, GK .
PHYSICAL REVIEW B, 1983, 27 (06) :3176-3200
[4]  
DUC TM, 1981, VIDE, V36, P307
[5]   XPS STUDY OF THE CHEMICAL-STRUCTURE OF THE NICKEL-SILICON INTERFACE [J].
GRUNTHANER, PJ ;
GRUNTHANER, FJ ;
MAYER, JW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05) :924-929
[6]   CHEMICAL BONDING AND SCHOTTKY-BARRIER FORMATION AT TRANSITION-METAL SILICON INTERFACES [J].
HO, PS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1983, 1 (02) :745-756
[7]   ENERGY-BAND THEORY OF AUGER LINE-SHAPES - SILICON L2,3VV AND LITHIUM KVV [J].
JENNISON, DR .
PHYSICAL REVIEW B, 1978, 18 (12) :6865-6871
[8]  
NGUYEN TTA, UNPUB PHYS SCRIPTA
[9]  
ORTEL B, 1976, THIN SOLID FILMS, V37, P185
[10]  
RINGEISEN F, 1983, UNPUB J VAC SCI TECH