PLASMA-ETCHING OF CVD GROWN CUBIC SIC SINGLE-CRYSTALS
被引:23
作者:
DOHMAE, S
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机构:Kyoto Univ, Dep of Electrical, Engineering, Kyoto, Jpn, Kyoto Univ, Dep of Electrical Engineering, Kyoto, Jpn
DOHMAE, S
SHIBAHARA, K
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h-index: 0
机构:Kyoto Univ, Dep of Electrical, Engineering, Kyoto, Jpn, Kyoto Univ, Dep of Electrical Engineering, Kyoto, Jpn
SHIBAHARA, K
论文数: 引用数:
h-index:
机构:
NISHINO, S
MATSUNAMI, H
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h-index: 0
机构:Kyoto Univ, Dep of Electrical, Engineering, Kyoto, Jpn, Kyoto Univ, Dep of Electrical Engineering, Kyoto, Jpn
MATSUNAMI, H
机构:
[1] Kyoto Univ, Dep of Electrical, Engineering, Kyoto, Jpn, Kyoto Univ, Dep of Electrical Engineering, Kyoto, Jpn
来源:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
|
1985年
/
24卷
/
11期
关键词:
CRYSTALS;
-;
Growth;
PLASMAS;
Applications;
D O I:
10.1143/JJAP.24.L873
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Plasma etching of CVD grown cubic SiC single crystals with CF//4 plus O//2 mixture gas was investigated for the first time. The O//2 gas composition, rf power and pressure dependence of the etching rate were clarified. The maximum etching rate was obtained with the O//2 gas composition of 67%. The ratio of the etching rate between cubic SiC and Cr was found to be about 8. 3, which indicates Cr as a good etching mask for cubic SiC.