EFFECTS OF PREADSORBED OXYGEN CONTAMINANT ON ADSORPTION OF AL ON SI (111)

[1] RECENT ADVANCES IN EPITAXY [J]. THIN SOLID FILMS, 1972, 12 (01) : 167 - +

[2] REACTIONS OF OXYGEN WITH PURE TUNGSTEN AND TUNGSTEN CONTAINING CARBON [J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (03) : 411 - &

[3] BLACK JR, 1970, NBS337 SPEC PUBL, P398

[4] AUGER ELECTRON SPECTROSCOPY [J]. SURFACE SCIENCE, 1971, 25 (01) : 53 - +

[5] Chopra K.L, 1969, THIN FILM PHENOMENA

[6] COHERENCE AREA IN LOW-ENERGY ELECTRON DIFFRACTION [J]. PHYSICS LETTERS A, 1967, A 24 (11) : 615 - &

[7] CHEMICAL SHIFTS IN AUGER SPECTRA FROM OXIDISED CHROMIUM AND VANADIUM [J]. PHYSICS LETTERS A, 1971, A 35 (03) : 185 - &

[8] DHEURLE F, 1968, T METALL SOC AIME, V242, P502

[9] SURFACE STUDIES BY ELECTRON DIFFRACTION [J]. SURFACE SCIENCE, 1971, 25 (01) : 1 - +

[10] Feinstein L. G., 1970, Surface Science, V19, P269, DOI 10.1016/0039-6028(70)90038-5

[1] RECENT ADVANCES IN EPITAXY [J]. THIN SOLID FILMS, 1972, 12 (01) : 167 - +

[2] REACTIONS OF OXYGEN WITH PURE TUNGSTEN AND TUNGSTEN CONTAINING CARBON [J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (03) : 411 - &

[3] BLACK JR, 1970, NBS337 SPEC PUBL, P398

[4] AUGER ELECTRON SPECTROSCOPY [J]. SURFACE SCIENCE, 1971, 25 (01) : 53 - +

[5] Chopra K.L, 1969, THIN FILM PHENOMENA

[6] COHERENCE AREA IN LOW-ENERGY ELECTRON DIFFRACTION [J]. PHYSICS LETTERS A, 1967, A 24 (11) : 615 - &

[7] CHEMICAL SHIFTS IN AUGER SPECTRA FROM OXIDISED CHROMIUM AND VANADIUM [J]. PHYSICS LETTERS A, 1971, A 35 (03) : 185 - &

[8] DHEURLE F, 1968, T METALL SOC AIME, V242, P502

[9] SURFACE STUDIES BY ELECTRON DIFFRACTION [J]. SURFACE SCIENCE, 1971, 25 (01) : 1 - +

[10] Feinstein L. G., 1970, Surface Science, V19, P269, DOI 10.1016/0039-6028(70)90038-5