Z1-OSCILLATIONS IN ION-INDUCED KINETIC ELECTRON-EMISSION

被引：22

作者：

THUM, F ^{[1
]}

HOFER, WO ^{[1
]}

机构：

[1] MAX PLANCK INST PLASMA PHYS, D-8046 GARCHING, FED REP GER

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1984年 / 2卷 / 1-3期

关键词：

D O I：

10.1016/0168-583X(84)90260-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：531 / 535

页数：5

共 27 条

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ALONSO, EV ;

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[3] LOW-NOISE, HIGH-VOLTAGE SECONDARY-EMISSION ION DETECTOR FOR POLYATOMIC IONS [J].

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INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1977, 23 (02) :81-97

[4] EXPERIMENTAL AND STATISTICAL INVESTIGATIONS ON MEASUREMENT OF VERY LOW ION CURRENTS IN MASS SPECTROMETERS [J].

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LIEBL, H ;

MULLER, N ;

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[5]

Bottiger J., 1970, Radiation Effects, V2, P105, DOI 10.1080/00337576908235591

[6]

Carter G., 1968, ION BOMBARDMENT SOLI

[7]

Cheshire I. M., 1970, Atomic collision phenomena in solids, P351

[8] SECONDARY-ELECTRON EMISSION INDUCED BY 5-30-KEV MONATOMIC IONS STRIKING THIN OXIDE-FILMS [J].

DIETZ, LA ;

SHEFFIELD, JC .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) :4361-4370

[9] SPECTROMETER FOR MEASURING SECONDARY-ELECTRON YIELDS INDUCED BY ION IMPACTS ON THIN-FILM OXIDE SURFACES [J].

DIETZ, LA ;

SHEFFIELD, JC .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (02) :183-191

[10] VARIANCE OF ION-ELECTRON COEFFICIENTS WITH ATOMIC NUMBER OF IMPACTING IONS [J].

FEHN, U .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1976, 21 (1-2) :1-14

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