ELECTRONIC-STRUCTURE OF COPPER DIAMOND INTERFACES INCLUDING EFFECTS OF INTERFACIAL HYDROGEN

被引:17
作者
LAMBRECHT, WRL
机构
[1] Department of Physics, Case Western Reserve University, Cleveland, OH
关键词
D O I
10.1016/0921-4526(93)90289-I
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The linear muffin-tin orbital method is used to study the electronic structure at Cu/diamond (111) interfaces. The geometries examined were: Cu on-top of surface-C (T1), Cu in 4-fold coordinated (T4) positions above second-layer C, and Cu on-top of H-atoms of the H-covered {111) surface. The Schottky barriers, layer-projected densities of states and interface energies were determined. The dangling-bond related interface states are shown to play an important role for the Schottky barrier heights, which are consistent with experimental data assuming that H was present at the interface. Interfacial hydrogen is shown to lower the adhesion dramatically.
引用
收藏
页码:512 / 527
页数:16
相关论文
共 56 条