AUTOMATED HALL PROFILING SYSTEM FOR THE CHARACTERIZATION OF SEMICONDUCTORS AT ROOM AND LIQUID-NITROGEN TEMPERATURES

被引：13

作者：

BLIGHT, SR

NICHOLLS, RE

SANGHA, SPS

KIRBY, PB

TEALE, L

HISCOCK, SP

STEWART, CP

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1988年 / 21卷 / 05期

关键词：

D O I：

10.1088/0022-3735/21/5/011

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：470 / 479

页数：10

共 16 条

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