共 24 条
[1]
STRUCTURAL-ANALYSIS OF THE NISI2/(111)SI INTERFACE BY THE X-RAY STANDING-WAVE METHOD
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
1985, 24 (11)
:1425-1431
[3]
EFFECT OF DYNAMICAL DIFFRACTION IN X-RAY FLUORESCENCE SCATTERING
[J].
PHYSICAL REVIEW A-GENERAL PHYSICS,
1964, 133 (3A)
:A759-&
[4]
CHEMS D, 1982, PHILOS MAG A, V46, P849
[5]
STRUCTURE DETERMINATION OF THE COSI2-SI(111) INTERFACE BY X-RAY STANDING-WAVE ANALYSIS
[J].
PHYSICAL REVIEW B,
1987, 36 (09)
:4769-4773
[6]
FOLL F, 1981, J APPL PHYS, V52, P250, DOI 10.1063/1.328440
[9]
HAMM RA, 1985, P MATER RES SOC, V37, P367
[10]
SCHOTTKY-BARRIER HEIGHT MEASUREMENTS OF TYPE-A AND TYPE-B NISI2 EPILAYERS ON SI
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1986, 4 (03)
:860-864