CHANNEL BUFFER (SUBSTRATE) INTERFACE PHENOMENA IN GAAS-MESFETS FABRICATED BY MOLECULAR-BEAM EPITAXY

被引:9
作者
SHENAI, K [1 ]
DUTTON, RW [1 ]
机构
[1] STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
关键词
D O I
10.1109/16.2501
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:590 / 603
页数:14
相关论文
共 41 条
[1]   DEEP STATES IN GAAS GROWN BY MOLECULAR-BEAM EPITAXY [J].
BLOOD, P ;
HARRIS, JJ .
JOURNAL OF APPLIED PHYSICS, 1984, 56 (04) :993-1007
[2]   LOW-TEMPERATURE PHOTO-LUMINESCENCE OF LIGHTLY SI-DOPED AND UNDOPED MBE GAAS [J].
BRIONES, F ;
COLLINS, DM .
JOURNAL OF ELECTRONIC MATERIALS, 1982, 11 (04) :847-866
[3]  
Cho A. Y., 1975, Progress in Solid State Chemistry, V10, P157, DOI 10.1016/0079-6786(75)90005-9
[4]   THE FIELD EFFECT TRANSISTOR [J].
DACEY, GC ;
ROSS, IM .
BELL SYSTEM TECHNICAL JOURNAL, 1955, 34 (06) :1149-1189
[5]  
DAVANZO D, 1982, IEEE T ELECTRON DEV, V29, P1051
[6]   COMPARISON OF GAAS DEVICE APPROACHES FOR ULTRAHIGH-SPEED VLSI [J].
EDEN, RC .
PROCEEDINGS OF THE IEEE, 1982, 70 (01) :5-12
[7]  
FLETCHER NH, 1956, J ELECTRON, V2, P609
[8]   CHARACTERIZATION OF STATIC BEHAVIOR OF P-N JUNCTION DEVICES [J].
FULKERSON, DE .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1967, ED14 (07) :385-+
[9]   BACKGATING AND LIGHT SENSITIVITY IN ION-IMPLANTED GAAS INTEGRATED-CIRCUITS [J].
GORONKIN, H ;
BIRRITTELLA, MS ;
SEELBACH, WC ;
VAITKUS, RL .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (05) :845-850
[10]   GENERAL THEORY FOR PINCHED OPERATION OF JUNCTION-GATE FET [J].
GREBENE, AB ;
GHANDHI, SK .
SOLID-STATE ELECTRONICS, 1969, 12 (07) :573-+