EXPERIMENTAL CONDITIONS REQUIRED TO ACHIEVE LOW-POWER PULSED-LASER ANNEALING OF IMPLANTED GAAS

被引:26
作者
VITALI, G
机构
[1] Dipartimento di Energetica, Università La Sapienza, Roma, Via A. Scarpa 14
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1992年 / 31卷 / 07期
关键词
GALLIUM ARSENIDE; LASER ANNEALING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
D O I
10.1143/JJAP.31.2049
中图分类号
O59 [应用物理学];
学科分类号
摘要
The experimental conditions necessary to obtain low-power pulsed-laser annealing (LPPLA) of implanted samples of GaAs are described. Simple theoretical estimates have been used to show that the sample's temperature evolution is such that it does not produce appreciable GaAs decomposition. Particular attention is paid to the spatial distribution of the energy over the laser beam cross section and the optical system used in the experiments. It is also pointed out that below the melting threshold, but above the upper limit of the energy window, within which the LPPLA is obtained, a structural disorder of the material is induced by the laser itself.
引用
收藏
页码:2049 / 2055
页数:7
相关论文
共 14 条
[1]   THICK EPITAXIAL FILMS OF CUBIC ZINC SULFIDE DEPOSITED BY A HOT WALL TECHNIQUE [J].
BEHRNDT, ME ;
MORENO, SC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (03) :494-+
[2]  
BRODSKY MK, 1990, SCI AM, V260, P52
[3]  
CULLITY BD, 1967, XRAY DIFFRACTION, P264
[4]   EVAPORATION OF GAAS UNDER EQUILIBRIUM AND NONEQUILIBRIUM CONDITIONS USING A MODULATED BEAM TECHNIQUE [J].
FOXON, CT ;
HARVEY, JA ;
JOYCE, BA .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1973, 34 (10) :1693-&
[5]   THE EFFECT OF LASER ANNEALING ON LASER-INDUCED DAMAGE THRESHOLD [J].
KERR, NC ;
EMMONY, DC .
JOURNAL OF MODERN OPTICS, 1990, 37 (04) :787-802
[6]   PULSED LASER ANNEALING OF ZINC IMPLANTED GAAS [J].
KULAR, SS ;
SEALY, BJ ;
STEPHENS, KG ;
CHICK, DR ;
DAVIS, QV ;
EDWARDS, J .
ELECTRONICS LETTERS, 1978, 14 (04) :85-87
[7]  
Morgan D. V., 1985, Gallium arsenide materials, devices, and circuits, P161
[8]   ABILITY OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) TO OBSERVE STRUCTURAL MODIFICATIONS IN ION-IMPLANTED AND ANNEALED GAAS [J].
ROSSI, M ;
VITALI, G ;
KARPUZOV, D ;
KALITZOVA, M ;
BUDINOV, H .
JOURNAL OF MATERIALS SCIENCE, 1991, 26 (12) :3337-3342
[9]   LOW-POWER PULSED-LASER ANNEALING OF IMPLANTED GAAS [J].
VITALI, G ;
ROSSI, M ;
KARPUZOV, D ;
BUDINOV, H ;
KALITZOVA, M .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (07) :3882-3885
[10]   RHEED AND RBS ANALYSIS OF LOW-POWER LASER ANNEALED GAAS [J].
VITALI, G ;
ROSSI, M ;
KARPUZOV, D ;
BUDINOV, H ;
KALITZOVA, M ;
KATARDJIEV, I .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 59 :1077-1080