SCANNING TUNNELING MICROSCOPE EQUIPPED WITH A FIELD-ION MICROSCOPE

被引：29

作者：

SAKURAI, T

HASHIZUME, T

KAMIYA, I

HASEGAWA, Y

IDE, T

MIYAO, M

SUMITA, I

SAKAI, A

HYODO, S

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 03期

关键词：

D O I：

10.1116/1.576070

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1684 / 1688

页数：5

共 17 条

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