共 21 条
- [2] MEASUREMENT OF INTERFACE STATE CHARACTERISTICS OF MOS-TRANSISTOR UTILIZING CHARGE-PUMPING TECHNIQUES [J]. IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION, 1981, 128 (02): : 44 - 52
- [4] ELMANSY YA, 1975, IEDM, P31
- [5] Guebels P. P., 1981, International Electron Devices Meeting, P211
- [8] Ko P. K., 1981, International Electron Devices Meeting, P600