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A NEW CONCEPT FOR IMPROVED ION AND ELECTRON LENSES - ABERRATION CORRECTED SYSTEMS OF PLANAR ELECTROSTATIC DEFLECTION ELEMENTS

被引：7
作者：
DALGLISH, RL
WINCHESTER, T
SMITH, AM
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期
关键词：
D O I：
10.1016/0167-5087(83)90945-6
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：7 / 10
页数：4
相关论文
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[3]   GEOMETRIC ABERRATION CORRECTION IN ION LENSES - THE CALEDONIAN QUADRUPLET [J].
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HUGHES, S .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 215 (1-2) :9-15
[4]   CORRECTED ELECTROSTATIC LENS SYSTEMS FOR ION-BEAMS [J].
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[5]  
KREJCIK P, 1979, J PHYS D, V12, P247
[6]   THE LOS-ALAMOS NUCLEAR MICRO-PROBE WITH A SUPERCONDUCTING SOLENOID FINAL LENS [J].
MAGGIORE, CJ .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3) :199-203
[7]  
MARTIN FW, 1982, APPL PHYS LETT, V40, P181
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