ANGULAR RESOLVED ENERGY-SPECTRA OF SECONDARY IONS

被引：12

作者：

FALCONE, G ^{[1
]}

OLIVA, A ^{[1
]}

SROUBEK, Z ^{[1
]}

机构：

[1] CISM COSENZA,UNITA GNSM,COSENZA,ITALY

来源：

SURFACE SCIENCE | 1986年 / 177卷 / 01期

关键词：

D O I：

10.1016/0039-6028(86)90269-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：221 / 228

页数：8

共 33 条

[1] ION MICROPROBE MASS ANALYZER [J].

ANDERSEN, CA ;

HINTHORNE, JR .

SCIENCE, 1972, 175 (4024) :853-+

[2] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES [J].

BENNINGHOVEN, A .

SURFACE SCIENCE, 1975, 53 (DEC) :596-625

[3] OBSERVATION ON SURFACE-REACTIONS WITH STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY .1. METHOD [J].

BENNINGHOVEN, A .

SURFACE SCIENCE, 1971, 28 (02) :541-+

[4] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J].

BENNINGHOVEN, A .

SURFACE SCIENCE, 1973, 35 (01) :427-457

[5] LOCALIZED TIME-DEPENDENT PERTURBATIONS IN METALS - FORMALISM AND SIMPLE EXAMPLES [J].

BLANDIN, A ;

NOURTIER, A ;

HONE, DW .

JOURNAL DE PHYSIQUE, 1976, 37 (04) :369-378

[6] SPUTTERING IN SURFACE ANALYSIS OF SOLIDS - DISCUSSION OF SOME PROBLEMS [J].

COBURN, JW .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (05) :1037-1044

[7]

DOBRETSOV LN, 1950, T FIZ TEKH I AKAD NA, V3, P39

[8] AN INTERPRETATION OF SIMS MEASUREMENTS AS A TOOL FOR INVESTIGATING THE IONIZATION PROCESS [J].

FALCONE, G ;

OLIVA, A .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3) :697-701

[9] FEMTOSECOND LASER INTERACTION WITH METALLIC TUNGSTEN AND NONEQUILIBRIUM ELECTRON AND LATTICE TEMPERATURES [J].

FUJIMOTO, JG ;

LIU, JM ;

IPPEN, EP ;

BLOEMBERGEN, N .

PHYSICAL REVIEW LETTERS, 1984, 53 (19) :1837-1840

[10] ENERGIES OF CU-1(+) IONS SPUTTERED FROM CU BY VERY LOW-ENERGY (50EV LESS-THAN E LESS-THAN 1 KEV) INERT-GAS IONS [J].

HART, RG ;

COOPER, CB .

SURFACE SCIENCE, 1980, 94 (01) :105-118

← 1 2 3 4 →