LOW-TEMPERATURE ATOMIC FORCE MICROSCOPY

被引:55
作者
KIRK, MD
ALBRECHT, TR
QUATE, CF
机构
关键词
D O I
10.1063/1.1139788
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:833 / 835
页数:3
相关论文
共 16 条
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