LOW-TEMPERATURE ATOMIC FORCE MICROSCOPY

[1] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) : 2599 - 2602

[2] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J]. EUROPHYSICS LETTERS, 1987, 3 (12): : 1281 - 1286

[3] SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) : 1688 - 1689

[4] BINNIG G, COMMUNICATION

[5] BINNIG G, 1986, PHYS REV LETT, V56, P939

[6] CHARGE-DENSITY WAVES OBSERVED WITH A TUNNELING MICROSCOPE [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (04) : 394 - 397

[7] MAMIN H, 1986, PHYS REV B, V35, P9015

[8] ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES [J]. APPLIED PHYSICS LETTERS, 1987, 51 (07) : 484 - 486

[9] ATOMIC FORCE MICROSCOPY OF AN ORGANIC MONOLAYER [J]. SCIENCE, 1988, 239 (4835) : 50 - 52

[10] ATOMIC-SCALE FRICTION OF A TUNGSTEN TIP ON A GRAPHITE SURFACE [J]. PHYSICAL REVIEW LETTERS, 1987, 59 (17) : 1942 - 1945

[1] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) : 2599 - 2602

[2] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J]. EUROPHYSICS LETTERS, 1987, 3 (12): : 1281 - 1286

[3] SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) : 1688 - 1689

[4] BINNIG G, COMMUNICATION

[5] BINNIG G, 1986, PHYS REV LETT, V56, P939

[6] CHARGE-DENSITY WAVES OBSERVED WITH A TUNNELING MICROSCOPE [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (04) : 394 - 397

[7] MAMIN H, 1986, PHYS REV B, V35, P9015

[8] ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES [J]. APPLIED PHYSICS LETTERS, 1987, 51 (07) : 484 - 486

[9] ATOMIC FORCE MICROSCOPY OF AN ORGANIC MONOLAYER [J]. SCIENCE, 1988, 239 (4835) : 50 - 52

[10] ATOMIC-SCALE FRICTION OF A TUNGSTEN TIP ON A GRAPHITE SURFACE [J]. PHYSICAL REVIEW LETTERS, 1987, 59 (17) : 1942 - 1945