1-F NOISE MEASUREMENTS FOR CHARACTERIZING MULTISPOT LOW-OHMIC CONTACTS

被引：20

作者：

VANDAMME, LKJ

TIJBURG, RP

机构：

[1] EINDHOVEN UNIV TECHNOL,DEPT ELECT ENGN,EINDHOVEN,NETHERLANDS

[2] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

JOURNAL OF APPLIED PHYSICS | 1976年 / 47卷 / 05期

关键词：

D O I：

10.1063/1.322935

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2056 / 2058

页数：3

共 11 条

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[8] 1/F NOISE OF POINT CONTACTS AFFECTED BY UNIFORM FILMS [J].

VANDAMME, LK .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (10) :4563-4565

[9] 1-F NOISE IN HOMOGENEOUS SINGLE-CRYSTALS OF III-V COMPOUNDS [J].

VANDAMME, LK .

PHYSICS LETTERS A, 1974, A 49 (03) :233-234

[10]

VANDAMME LKJ, 1975, 4TH INT C PHYS ASP N, P97

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