OXYGEN TRACER DIFFUSION IN VITREOUS SILICA

被引：76

作者：

KALEN, JD

BOYCE, RS

CAWLEY, JD

机构：

[1] Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1991年 / 74卷 / 01期

关键词：

D O I：

10.1111/j.1151-2916.1991.tb07318.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Oxygen diffusion in vitreous silica glass is studied using the gas exchange technique. The tracer concentration profiles are consistent with a model based on two mechanisms, one network and the other interstitial. These processes are coupled through limited network-interstitial exchange. Nuclear reaction analysis and secondary ion mass spectrometry techniques are performed and compared. These results are compared to experiments on transport in thin silica films grown on single-crystal silicon.

引用

页码：203 / 209

页数：7

共 20 条

[1] MICROANALYSIS OF STABLE ISOTOPES OF OXYGEN BY MEANS OF NUCLEAR REACTIONS [J].