INTERFEROMETRIC MEASUREMENT OF THE PRESSURE-ENHANCED CRYSTALLIZATION RATE OF AMORPHOUS SI

被引：31

作者：

LU, GQ ^{[1
]}

NYGREN, E ^{[1
]}

AZIZ, MJ ^{[1
]}

TURNBULL, D ^{[1
]}

WHITE, CW ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,DIV SOLID STATE,OAK RIDGE,TN 37831

来源：

APPLIED PHYSICS LETTERS | 1989年 / 54卷 / 25期

关键词：

D O I：

10.1063/1.101056

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：2583 / 2585

页数：3

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