METHOD TO DETERMINE THE ANALYSIS AREA OF X-RAY PHOTOELECTRON SPECTROMETERS ILLUSTRATED BY A PERKIN-ELMER PHI 550 ESCA SAM

被引：31

作者：

SEAH, MP ^{[1
]}

MATHIEU, HJ ^{[1
]}

机构：

[1] SWISS FED INST TECHNOL,DEPT MAT,CH-1007 LAUSANNE,SWITZERLAND

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1985年 / 56卷 / 05期

关键词：

D O I：

10.1063/1.1138210

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：703 / 711

页数：9

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