A new apparatus for surface x-ray absorption and diffraction studies using synchrotron radiation

被引:12
作者
Oyanagi, H
Owen, I
Grimshaw, M
Head, P
Martini, M
Saito, M
机构
[1] VACUUM GENERATORS,HASTINGS TN38 9PX,E SUSSEX,ENGLAND
[2] PETER HEAD ASSOCIATES,WITCHFORD CB6 2HQ,CAMBS,ENGLAND
[3] EG&G ORTEC,OAK RIDGE,TN 37830
[4] SEIKO EG&G,KOTO KU,TOKYO 136,JAPAN
关键词
D O I
10.1063/1.1146072
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A new apparatus for structural studies of surfaces and buried interfaces using synchrotron radiation was built and tested at the 27-pole wiggler station BL13B of the Photon Factory. The apparatus was designed to combine x-ray absorption fine structure (XAFS), x-ray standing wave (XSW), and surface x-ray diffraction techniques in the same ultrahigh vacuum (UHV) chamber. The apparatus features a seven-element Si(Li) solid-state detector array for a fluorescence yield measurement and a high precision eight-axis goniometer in the UHV chamber with a base pressure of 1X10(-10) Torr. For the same sample mounted on the in-vacuum goniometer, vertically or horizontally polarized surface-sensitive XAFS, surface x-ray diffraction, and XSW can be measured. As a performance test, the structure of Ge overlayers on Si(001) was studied by polarized surface-sensitive XAFS. The results show that the apparatus can probe the local structure of adatoms with similar to 0.1 monolayer sensitivity. (C) 1995 American Institute of Physics.
引用
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页码:5477 / 5485
页数:9
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