CALIBRATION AND USE OF A LITHIUM-DRIFTED SILICON DETECTOR FOR ACCURATE ANALYSIS OF X-RAY-SPECTRA

被引：17

作者：

KEITH, HD ^{[1
]}

LOOMIS, TC ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

关键词：

D O I：

10.1002/xrs.1300050210

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：93 / 103

页数：11

共 7 条

[1] SURFACE BARRIER STRUCTURES WITH VARIOUS METAL ELECTRODES
INSKEEP, C
ELAD, E
SAREEN, RA
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1974, NS21 (01) : 379 - 385
[2] ACCURATE CALIBRATION OF EFFICIENCIES OF X-RAY DETECTORS - FLOW-PROPORTIONAL AND SCINTILLATION-COUNTERS
LOOMIS, TC
KEITH, HD
[J]. APPLIED SPECTROSCOPY, 1975, 29 (04) : 316 - 322
[3] LOOMIS TC, 1975, XRAY SPECTROM, V5, P104
[4] Reed S. J. B., 1973, XRAY SPECTROMETRY, V2, P69, DOI [10.1002/xrs.1300020206, DOI 10.1002/XRS.1300020206]
[5] ESCAPE PEAKS AND INTERNAL FLUORESCENCE IN X-RAY-SPECTRA RECORDED WITH LITHIUM DRIFTED SILICON DETECTORS
REED, SJB
WARE, NG
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (06): : 582 - &
[6] BACKGROUND CORRECTIONS FOR QUANTITATIVE ELECTRON-MICROPROBE ANALYSIS USING A LITHIUM DRIFTED SILICON X-RAY DETECTOR
WARE, NG
REED, SJB
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (03): : 286 - 288
[7] Warren B. E., 1969, XRAY DIFFRACTION