STUDIES ON SI(111)-SQUARE-ROOT X SQUARE-ROOT-3-BI AND -AG SURFACES BY X-RAY-DIFFRACTION UNDER NEARLY NORMAL INCIDENCE

被引：7

作者：

TAKAHASHI, T

NAKATANI, S

OKAMOTO, N

ISHIKAWA, T

KIKUTA, S

机构：

[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

[2] UNIV TOKYO,FAC ENGN,TOKYO 113,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 07期

关键词：

D O I：

10.1063/1.1140721

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2365 / 2368

页数：4

共 29 条

[21] STRUCTURE OF THE AG ON SI(111) 7X7 INTERFACE BY MEANS OF SURFACE EXAFS [J].

STOHR, J ;

JAEGER, R ;

ROSSI, G ;

KENDELEWICZ, T ;

LINDAU, I .

SURFACE SCIENCE, 1983, 134 (03) :813-835

[22] EVIDENCE FOR A TRIMER IN THE SQUARE-ROOT-3XSQUARE-ROOT-3-BI STRUCTURE ON THE SI(111) SURFACE BY X-RAY-DIFFRACTION UNDER THE NEARLY NORMAL INCIDENCE CONDITION [J].

TAKAHASHI, T ;

IZUMI, K ;

ISHIKAWA, T ;

KIKUTA, S .

SURFACE SCIENCE, 1987, 183 (1-2) :L302-L312

[23]

TAKAHASHI T, 1987, SURF SCI, V191, pL825, DOI 10.1016/S0039-6028(87)81179-2

[24] STUDY ON THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG SURFACE-STRUCTURE BY X-RAY-DIFFRACTION [J].

TAKAHASHI, T ;

NAKATANI, S ;

OKAMOTO, N ;

ISHIKAWA, T ;

KIKUTA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1988, 27 (05) :L753-L755

[25]

TERADA Y, 1982, SURF SCI, V114, P65, DOI 10.1016/0039-6028(82)90456-3

[26] LOCAL ELECTRON-STATES AND SURFACE GEOMETRY OF SI(111)-(SQUARE-ROOT 3 X SQUARE-ROOT 3)AG [J].

VANLOENEN, EJ ;

DEMUTH, JE ;

TROMP, RM ;

HAMERS, RJ .

PHYSICAL REVIEW LETTERS, 1987, 58 (04) :373-376

[27] INVESTIGATION OF INITIAL-STAGES OF GROWTH OF AGFILMS ON SI(111)7X7 BY A COMBINATION OF LEED, AES, AND UPS [J].

WEHKING, F ;

BECKERMANN, H ;

NIEDERMAYER, R .

SURFACE SCIENCE, 1978, 71 (02) :364-374

[28] STRUCTURE OF THE AG/SI(111) SURFACE BY SCANNING TUNNELING MICROSCOPY [J].

WILSON, RJ ;

CHIANG, S .

PHYSICAL REVIEW LETTERS, 1987, 58 (04) :369-372

[29] REGISTRATION AND NUCLEATION OF THE AG/SI(111) (SQUARE-ROOT-3XSQUARE-ROOT-3) R30-DEGREES STRUCTURE BY SCANNING TUNNELING MICROSCOPY [J].

WILSON, RJ ;

CHIANG, S .

PHYSICAL REVIEW LETTERS, 1987, 59 (20) :2329-2332

← 1 2 3 →