SINGLE EVENT EFFECTS IN ANALOG-TO-DIGITAL CONVERTERS - DEVICE PERFORMANCE AND SYSTEM IMPACT

被引：15

作者：

TURFLINGER, TL

DAVEY, MV

MAPPES, BM

机构：

[1] Crane Division, Naval Surface Warfare Center, Crane, Indiana

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1994年 / 41卷 / 06期

关键词：

Analog to digital converters - Single event effects;

D O I：

10.1109/23.340561

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Monolithic Analog-to-Digital Converters (ADCs) exhibit a large error rate in the single event effects (SEE) environment. Analysis of data from a high-performance ADC demonstrates the type of errors and their potential impact on system performance.

引用

页码：2187 / 2194

页数：8

共 5 条

[1] RATE PREDICTION FOR SINGLE EVENT EFFECTS - A CRITIQUE [J].

PETERSEN, EL ;

PICKEL, JC ;

ADAMS, JH ;

SMITH, EC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1992, 39 (06) :1577-1599

[2] TRANSIENT RADIATION TEST TECHNIQUES FOR HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERS [J].

TURFLINGER, TL ;

DAVEY, MV .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1989, 36 (06) :2356-2361

[3] UNDERSTANDING SINGLE EVENT PHENOMENA IN COMPLEX ANALOG AND DIGITAL INTEGRATED-CIRCUITS [J].

TURFLINGER, TL ;

DAVEY, MV .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (06) :1832-1838

[4]

MADCAT TESTER

[5]

1994 MILITARY AEROSP, P6

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