ASSESSMENT OF SPECIMEN NOISE IN HREM IMAGES OF SIMPLE STRUCTURES

被引：14

作者：

PACIORNIK, S

KILAAS, R

DAHMEN, U

机构：

[1] National Center for Electron Microscopy, MSD, Lawrence Berkeley Laboratory, Berkeley

来源：

ULTRAMICROSCOPY | 1993年 / 50卷 / 03期

关键词：

D O I：

10.1016/0304-3991(93)90194-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Displacements of image spots representing atomic columns in a high resolution image may be due either to displacements of atomic columns or to specimen noise. The effect of specimen noise on the accuracy with which an atomic column can be located is assessed by evaluating the root mean square deviation of the intensity center of mass of image dots. Optimized methods for experimental assessment of this effect are developed and applied to simulated and experimental images.

引用

页码：255 / 262

页数：8

共 17 条

[1] DIRECT MEASUREMENT OF LOCAL LATTICE-DISTORTIONS IN STRAINED LAYER STRUCTURES BY HREM
BIERWOLF, R
HOHENSTEIN, M
PHILLIPP, F
BRANDT, O
CROOK, GE
PLOOG, K
[J]. ULTRAMICROSCOPY, 1993, 49 (1-4) : 273 - 285
[2] BOURRET A, 1989, MATER RES SOC S P, V138, P3
[3] ATOMIC-STRUCTURE OF A SIGMA-99 GRAIN-BOUNDARY IN ALUMINUM - A COMPARISON BETWEEN ATOMIC-RESOLUTION OBSERVATION AND PAIR-POTENTIAL AND EMBEDDED-ATOM SIMULATIONS
DAHMEN, U
HETHERINGTON, CJD
OKEEFE, MA
WESTMACOTT, KH
MILLS, MJ
DAW, MS
VITEK, V
[J]. PHILOSOPHICAL MAGAZINE LETTERS, 1990, 62 (05) : 327 - 335
[4] GIBSON JM, 1987, MATER RES SOC S P, V82, P109
[5] HETHERINGTON CJD, 1992, IN PRESS P PFEFFERKO
[6] HULL R, 1990, MATER RES SOC SYMP P, V183, P91, DOI 10.1557/PROC-183-91
[7] THE EFFECT OF AMORPHOUS SURFACE-LAYERS ON IMAGES OF CRYSTALS IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
KILAAS, R
GRONSKY, R
[J]. ULTRAMICROSCOPY, 1985, 16 (02) : 193 - 201
[8] KILAAS R, 1987, 22ND P ANN M MICR AN, P293
[9] KING WE, IN PRESS REFINEMENT
[10] MILLS MF, COMMUNICATION

← 1 2 →