ASSESSMENT OF SPECIMEN NOISE IN HREM IMAGES OF SIMPLE STRUCTURES

被引:14
作者
PACIORNIK, S
KILAAS, R
DAHMEN, U
机构
[1] National Center for Electron Microscopy, MSD, Lawrence Berkeley Laboratory, Berkeley
关键词
D O I
10.1016/0304-3991(93)90194-3
中图分类号
TH742 [显微镜];
学科分类号
摘要
Displacements of image spots representing atomic columns in a high resolution image may be due either to displacements of atomic columns or to specimen noise. The effect of specimen noise on the accuracy with which an atomic column can be located is assessed by evaluating the root mean square deviation of the intensity center of mass of image dots. Optimized methods for experimental assessment of this effect are developed and applied to simulated and experimental images.
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页码:255 / 262
页数:8
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