SEMICONDUCTOR MICROLASER LINEWIDTHS

被引：76

作者：

MOHIDEEN, U ^{[1
]}

SLUSHER, RE ^{[1
]}

JAHNKE, F ^{[1
]}

KOCH, SW ^{[1
]}

机构：

[1] UNIV ARIZONA,CTR OPT SCI,TUCSON,AZ 85721

来源：

PHYSICAL REVIEW LETTERS | 1994年 / 73卷 / 13期

关键词：

D O I：

10.1103/PhysRevLett.73.1785

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Semiconductor microdisk laser linewidths are measured for cavity volumes near a cubic wavelength. The linewidths remain near the subthreshold values for pump powers well above threshold in agreement with a microscopic theory that includes the coupled dynamics of the optical emission and the nonequilibrium electron-hole gas in the cavity.

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页码：1785 / 1788

页数：4

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