DESIGN AND DETAILED ANALYSIS OF A SCANNING TUNNELING MICROSCOPE

被引：22

作者：

GRAFSTROM, S

KOWALSKI, J

NEUMANN, R

机构：

[1] Phys. Inst., Heidelberg Univ.

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1990年 / 1卷 / 02期

关键词：

D O I：

10.1088/0957-0233/1/2/007

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A scanning tunnelling microscope (STM) is described which uses a double-lever reduction system with a single micrometer-drive for the coarse sample-to-tip approach and a thermally compensated single-tube piezo scanner for the tip movement. The microscope is equipped with versatile analogue electronics, and the data acquisition is computer-automated. The principal considerations are two main problems in the design of the STM electronics: the current control circuit and the current-sensing preamplifier. The performance of the STM is illustrated with images of gold and graphite samples.

引用

页码：139 / 146

页数：8

共 21 条

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