MODELING OF INTEGRATED-CIRCUIT DEFECT SENSITIVITIES

被引：129

作者：

STAPPER, CH

机构：

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1983年 / 27卷 / 06期

关键词：

D O I：

10.1147/rd.276.0549

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：549 / 557

页数：9

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