INFRARED-ABSORPTION BAND FOR SUBSTITUTIONAL NITROGEN IN SILICON

被引:38
作者
STEIN, HJ
机构
关键词
D O I
10.1063/1.96273
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1339 / 1341
页数:3
相关论文
共 7 条
  • [1] ABE T, 1981, SEMICONDUCTOR SILICO, P54
  • [2] DEEP-LEVEL NITROGEN CENTERS IN LASER-ANNEALED ION-IMPLANTED SILICON
    BROWER, KL
    [J]. PHYSICAL REVIEW B, 1982, 26 (11): : 6040 - 6052
  • [3] ITOH H, 1984, 15TH S ION IMPL SUBM
  • [4] ION-IMPLANTED NITROGEN IN GALLIUM-ARSENIDE
    KACHARE, AH
    KAHAN, A
    EULER, FK
    WHATLEY, TA
    SPITZER, WG
    [J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (10) : 4393 - 4399
  • [5] SUBSTITUTIONAL NITROGEN IMPURITIES IN PULSED-LASER ANNEALED SILICON
    MURAKAMI, K
    ITOH, H
    TAKITA, K
    MASUDA, K
    [J]. APPLIED PHYSICS LETTERS, 1984, 45 (02) : 176 - 178
  • [6] NEWMAN RC, 1973, INFRARED STUDIES CRY
  • [7] Stein H. J., 1985, Thirteenth International Conference on Defects in Semiconductors, P839