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PROCESS AND FILM CHARACTERIZATION OF LOW-PRESSURE TETRAETHYLORTHOSILICATE-BOROPHOSPHOSILICATE GLASS
被引:77
作者
:
BECKER, FS
论文数:
0
引用数:
0
h-index:
0
BECKER, FS
PAWLIK, D
论文数:
0
引用数:
0
h-index:
0
PAWLIK, D
SCHAFER, H
论文数:
0
引用数:
0
h-index:
0
SCHAFER, H
STAUDIGL, G
论文数:
0
引用数:
0
h-index:
0
STAUDIGL, G
机构
:
来源
:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
|
1986年
/ 4卷
/ 03期
关键词
:
D O I
:
10.1116/1.583564
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:732 / 744
页数:13
相关论文
共 124 条
[1]
STRESSES IN SIO2 FILMS OBTAINED FROM THERMAL DECOMPOSITION OF TETRAETHYLORTHOSILICATE - EFFECT OF HEAT TREATMENT AND HUMIDITY
ABOAF, JA
论文数:
0
引用数:
0
h-index:
0
ABOAF, JA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969,
116
(12)
: 1732
-
&
[2]
ACHARD H, 1983, ECS EXT ABSTR, P365
[3]
Adams A. C., 1983, VLSI technology, P93
[4]
PLANARIZATION OF PHOSPHORUS-DOPED SILICON DIOXIDE
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
ADAMS, AC
CAPIO, CD
论文数:
0
引用数:
0
h-index:
0
CAPIO, CD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1981,
128
(02)
: 423
-
429
[5]
DEPOSITION OF SILICON DIOXIDE FILMS AT REDUCED PRESSURE
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
CAPIO, CD
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
CAPIO, CD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(06)
: 1042
-
1046
[6]
MEASURING THE PHOSPHORUS CONCENTRATION IN DEPOSITED PHOSPHOSILICATE FILMS
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
MURARKA, SP
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
MURARKA, SP
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(02)
: 334
-
338
[7]
LOW-TEMPERATURE DEPOSITION OF PYROLYTIC SIO2 FOR PASSIVATING SEMICONDUCTOR POWER DIODES
ALBELLA, JM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV AUTONOMA MADRID,DEPT FIS,MADRID 34,SPAIN
ALBELLA, JM
CRIADO, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV AUTONOMA MADRID,DEPT FIS,MADRID 34,SPAIN
CRIADO, A
MUNOZMERINO, E
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV AUTONOMA MADRID,DEPT FIS,MADRID 34,SPAIN
MUNOZMERINO, E
[J].
THIN SOLID FILMS,
1976,
36
(02)
: 479
-
482
[8]
LOW-TEMPERATURE DEPOSITION OF SILICON OXIDE FILMS
ALT, LL
论文数:
0
引用数:
0
h-index:
0
ALT, LL
ING, SW
论文数:
0
引用数:
0
h-index:
0
ING, SW
LAENDLE, KW
论文数:
0
引用数:
0
h-index:
0
LAENDLE, KW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1963,
110
(05)
: 465
-
465
[9]
ALVI NS, 1985, ECS EXT ABSTR, P373
[10]
STRUCTUAL CHANGES OF ARSENIC SILICATE GLASSES WITH HEAT TREATMENTS
ARAI, E
论文数:
0
引用数:
0
h-index:
0
ARAI, E
TERUNUMA, Y
论文数:
0
引用数:
0
h-index:
0
TERUNUMA, Y
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1970,
9
(06)
: 691
-
+
←
1
2
3
4
5
6
7
8
9
10
→
共 124 条
[1]
STRESSES IN SIO2 FILMS OBTAINED FROM THERMAL DECOMPOSITION OF TETRAETHYLORTHOSILICATE - EFFECT OF HEAT TREATMENT AND HUMIDITY
ABOAF, JA
论文数:
0
引用数:
0
h-index:
0
ABOAF, JA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1969,
116
(12)
: 1732
-
&
[2]
ACHARD H, 1983, ECS EXT ABSTR, P365
[3]
Adams A. C., 1983, VLSI technology, P93
[4]
PLANARIZATION OF PHOSPHORUS-DOPED SILICON DIOXIDE
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
ADAMS, AC
CAPIO, CD
论文数:
0
引用数:
0
h-index:
0
CAPIO, CD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1981,
128
(02)
: 423
-
429
[5]
DEPOSITION OF SILICON DIOXIDE FILMS AT REDUCED PRESSURE
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
CAPIO, CD
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
CAPIO, CD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(06)
: 1042
-
1046
[6]
MEASURING THE PHOSPHORUS CONCENTRATION IN DEPOSITED PHOSPHOSILICATE FILMS
ADAMS, AC
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
ADAMS, AC
MURARKA, SP
论文数:
0
引用数:
0
h-index:
0
机构:
Bell Laboratories, Murray Hill
MURARKA, SP
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(02)
: 334
-
338
[7]
LOW-TEMPERATURE DEPOSITION OF PYROLYTIC SIO2 FOR PASSIVATING SEMICONDUCTOR POWER DIODES
ALBELLA, JM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV AUTONOMA MADRID,DEPT FIS,MADRID 34,SPAIN
ALBELLA, JM
CRIADO, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV AUTONOMA MADRID,DEPT FIS,MADRID 34,SPAIN
CRIADO, A
MUNOZMERINO, E
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV AUTONOMA MADRID,DEPT FIS,MADRID 34,SPAIN
MUNOZMERINO, E
[J].
THIN SOLID FILMS,
1976,
36
(02)
: 479
-
482
[8]
LOW-TEMPERATURE DEPOSITION OF SILICON OXIDE FILMS
ALT, LL
论文数:
0
引用数:
0
h-index:
0
ALT, LL
ING, SW
论文数:
0
引用数:
0
h-index:
0
ING, SW
LAENDLE, KW
论文数:
0
引用数:
0
h-index:
0
LAENDLE, KW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1963,
110
(05)
: 465
-
465
[9]
ALVI NS, 1985, ECS EXT ABSTR, P373
[10]
STRUCTUAL CHANGES OF ARSENIC SILICATE GLASSES WITH HEAT TREATMENTS
ARAI, E
论文数:
0
引用数:
0
h-index:
0
ARAI, E
TERUNUMA, Y
论文数:
0
引用数:
0
h-index:
0
TERUNUMA, Y
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1970,
9
(06)
: 691
-
+
←
1
2
3
4
5
6
7
8
9
10
→