共 11 条
- [1] STOICHIOMETRY DETERMINATION OF REACTIVELY SPUTTERED TITANIUM-SILICIDE [J]. VACUUM, 1982, 32 (10-1) : 665 - 667
- [2] BLOM HO, 1986, THIN SOLID FILMS, V130, P307
- [3] GERAGHTY KG, 1976, J ELECTROCHEM SOC, V123, P141
- [4] GLOW-DISCHARGE OPTICAL SPECTROSCOPY FOR MONITORING SPUTTER DEPOSITED FILM THICKNESS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (06): : 1144 - 1149
- [5] PARTIAL-PRESSURE CONTROL OF REACTIVELY SPUTTERED TITANIUM NITRIDE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 592 - 595
- [7] VOLTAGE-CONTROLLED, REACTIVE PLANAR MAGNETRON SPUTTERING OF AIN THIN-FILMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 376 - 378
- [9] REACTIVE MAGNETRON SPUTTERING OF TITANIUM AND ITS OXIDES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (04): : 1389 - 1392
- [10] OSTLING S, 1984, J VAC SCI TECHNOL A, V2, P281