AN ANALYTICAL METHOD FOR DETERMINING INTRINSIC DRAIN SOURCE RESISTANCE OF LIGHTLY DOPED DRAIN (LDD) DEVICES

被引：14

作者：

DUVVURY, C

BAGLEE, D

DUANE, M

HYSLOP, A

SMAYLING, M

MAEKAWA, M

机构：

来源：

SOLID-STATE ELECTRONICS | 1984年 / 27卷 / 01期

关键词：

D O I：

10.1016/0038-1101(84)90097-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：89 / 96

页数：8

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