A COMPARISON OF SEVERAL COMPONENT-TESTING PLANS FOR A PARALLEL SYSTEM

被引：9

作者：

YAN, JH

MAZUMDAR, M

机构：

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1987年 / 36卷 / 04期

关键词：

D O I：

10.1109/TR.1987.5222428

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：419 / 424

页数：6

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