DE-CORRELATION EFFECTS IN SPECKLE-PATTERN INTERFEROMETRY .2. DISPLACEMENT DEPENDENT DE-CORRELATION AND APPLICATIONS TO OBSERVATION OF MACHINE-INDUCED STRAIN

被引：27

作者：

JONES, R ^{[1
]}

WYKES, C ^{[1
]}

机构：

[1] LOUGHBOROUGH UNIV TECHNOL,DEPT MECH ENGN,LOUGHBOROUGH LE11 3TU,LEICESTERSHIRE,ENGLAND

来源：

OPTICA ACTA | 1977年 / 24卷 / 05期

关键词：

D O I：

10.1080/716099421

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：533 / 550

页数：18

共 9 条

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[2] Beckmann P., 1963, SCATTERING ELECTROMA, P17
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BUTTERS, JN
LEENDERTZ, JA
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[4] DWIGHT MB, 1972, TABLES INTEGRALS OTH
[5] GOODMAN JW, 1975, STATISTICAL PROPERTI, V9
[6] WHITE-LIGHT PROJECTION TECHNIQUE FOR VIEWING DOUBLE-EXPOSURE SPECKLE INTERFEROGRAMS
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[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (08): : 616 - 616
[7] LEENDERTZ JA, 1970, J PHYS E, V4, P272
[8] TANNER LM, 1968, J PHYS E, V7, P517
[9] DE-CORRELATION EFFECTS IN SPECKLE-PATTERN INTERFEROMETRY .1. WAVELENGTH CHANGE DEPENDENT DE-CORRELATION WITH APPLICATION TO CONTOURING AND SURFACE-ROUGHNESS MEASUREMENT
WYKES, C
[J]. OPTICA ACTA, 1977, 24 (05): : 517 - 532