DOUBLE CORRELATION TECHNIQUE (DDLTS) FOR ANALYSIS OF DEEP LEVEL PROFILES IN GAAS AND GAAS0.6P0.4

被引：25

作者：

LEFEVRE, H ^{[1
]}

SCHULZ, M ^{[1
]}

机构：

[1] FRAUNHOFER GESELL,INST ANGEW FESTKORPERPHYS,D-7800 FREIBURG,FED REP GER

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1977年 / 24卷 / 07期

关键词：

D O I：

10.1109/T-ED.1977.18863

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：973 / 978

页数：6

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