ELECTRON-HOLE RECOMBINATION ANTIBLOOMING FOR VIRTUAL-PHASE CCD IMAGER

被引：14

作者：

HYNECEK, J

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1983年 / 30卷 / 08期

关键词：

D O I：

10.1109/T-ED.1983.21241

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：941 / 948

页数：8

相关论文

共 16 条

[1]

ANTONIADIS DA, 50192 STANF U STANF

[2] CHARGE-INJECTION IMAGING - OPERATING TECHNIQUES AND PERFORMANCES CHARACTERISTICS [J].

BURKE, HK ;

MICHON, GJ .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1976, 23 (02) :189-196

[3] ZERO-PHONON TRANSITION OF FREE-ELECTRONS TO BOUND HOLES IN HEAVILY GALLIUM-DOPED SILICON [J].

DAI, R ;

UEBBING, R ;

LINNEBACH, R .

JOURNAL OF LUMINESCENCE, 1982, 26 (03) :233-238

[4] USE OF CHARGE PUMPING CURRENTS TO MEASURE SURFACE STATE DENSITIES IN MOS-TRANSISTORS [J].

ELLIOT, ABM .

SOLID-STATE ELECTRONICS, 1976, 19 (03) :241-247

[5] APERTURE RESPONSE AND OPTICAL-PERFORMANCE OF PATTERNED-ELECTRODE VIRTUAL-PHASE IMAGERS [J].

HOSACK, HH .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (01) :53-63

[6]

HOWES MJ, 1980, CHARGE COUPLED DEVIC, P56

[7] VIRTUAL PHASE TECHNOLOGY - A NEW APPROACH TO FABRICATION OF LARGE-AREA CCDS [J].

HYNECEK, J .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (05) :483-489

[8]

Ishihara Y., 1982, ISSCC, P168

[9]

JANESICK J, 1981, SPIE J, V290, P165

[10]

KOSONOCKY WF, 1975, RCA REV, V36, P566