LOW-PRESSURE DEPOSITION OF DOPED SIO2 BY PYROLYSIS OF TETRAETHYLORTHOSILICATE (TEOS) .1. BORON AND PHOSPHORUS DOPED FILMS

被引:42
作者
BECKER, FS [1 ]
ROHL, S [1 ]
机构
[1] SIEMENS AG,CTR MICROELECTR TECHNOL,D-8000 MUNICH 83,FED REP GER
关键词
GLASS; -; Pyrolysis; SILICATES;
D O I
10.1149/1.2100314
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Borophosphosilicate glass (BPSG) with high dopant levels has been obtained by combining the low pressure TEOS-borosilicate glass (BSG) and phosphosilicate glass (PSG) processes at an optimum deposition temperature of 620 degree C. The process has been improved with regard to uniformity and run-to-run stability by introducing the trimethylborate used for the boron doping from the front end, while the phosphine employed requires a quartz injector. Experiments with BPSG and BSG showed that a void free trench filliing is only feasible for trenches with tapered walls, but a heat-treatment at 900 degree C reduces the cavities to small bubbles in the trench center and planarizes the surface.
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页码:2923 / 2931
页数:9
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