CHEMICAL VAPOR INFILTRATION OF SIXC1-X FILMS FOR THE PREPARATION OF COMPOSITE-MATERIALS USING BOTH ORGANOSILICON AND HYDROCARBON PRECURSORS

被引:5
作者
AGULLO, JM
MAURY, F
MORANCHO, R
机构
[1] Laboratoire de Cristallochimie, Réactivité et Protection des Matériaux, URA CNRS 445, F-31077 Toulouse Cedex
关键词
D O I
10.1016/0040-6090(92)90009-Z
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The chemical vapour infiltration of porous carbon fibre preforms by SixC1-x has been investigated. SiEt4 has been used as both volatile silicon and carbon source and a further carbon enrichment of these films has been achieved by addition of cumene in the gas phase. The composition of infiltrated films is not significantly different from that of coatings grown on the outer surface of the samples. The infiltration efficiency defined by the thickness uniformity inside the porous preforms has been found to be better at low pressure and low temperature. However, weight gain measurements have revealed a slow rate of deposition in such conditions. The infiltration quality is discussed in terms of both these factors as a function of temperature, pressure and initial gas phase composition to evaluate the most appropriate conditions for large-scale applications of this process.
引用
收藏
页码:52 / 58
页数:7
相关论文
共 27 条
[1]   CHEMICAL AND STRUCTURAL CHARACTERIZATIONS OF CHEMICAL VAPOR-DEPOSITED SIXC1-X FILMS [J].
AGULLO, JM ;
MAURY, F ;
MORANCHO, R ;
CARLES, R .
MATERIALS LETTERS, 1991, 11 (8-9) :257-260
[2]  
AGULLO JM, 1990, THESIS TOULOUSE
[3]  
Armitage D. A., 1982, COMPREHENSIVE ORGANO, V2, P1
[4]   A METHOD FOR RAPID CHEMICAL VAPOR INFILTRATION OF CERAMIC COMPOSITES [J].
BESMANN, TM ;
LOWDEN, RA ;
STINTON, DP ;
STARR, TL .
JOURNAL DE PHYSIQUE, 1989, 50 (C-5) :229-239
[5]  
BESMANN TM, 1990, 11TH P INT C CHEM VA, P482
[6]   INTERFACIAL STUDIES OF CHEMICAL-VAPOR-INFILTRATED CERAMIC MATRIX COMPOSITES [J].
BRENNAN, JJ .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1990, 126 :203-223
[7]  
CAPUTO AJ, 1987, AM CERAM SOC BULL, V66, P368
[8]   INSTRUMENT-INVARIANT METHOD OF FILM THICKNESS DETERMINATION BY MEANS OF SUBSTRATE-TO-FILM X-RAY PEAK INTENSITY RATIOING [J].
CHURMS, CL ;
KRITZINGER, S .
THIN SOLID FILMS, 1987, 148 (01) :67-74
[9]  
DERRE A, 1987, 10TH P INT C CHEM VA, P119
[10]   ESCA STUDY OF ORGANOSILICON COMPOUNDS [J].
GRAY, RC ;
CARVER, JC ;
HERCULES, DM .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (05) :343-357