EXTRACTION FIELD AND OXIDE CHARGING IN VOLTAGE CONTRAST SYSTEMS

被引:11
作者
NYE, P
DINNIS, A
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关键词
D O I
10.1002/sca.4950070304
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:117 / 124
页数:8
相关论文
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MENZEL, E ;
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SCANNING, 1983, 5 (04) :151-171
[2]   DIGITAL-TECHNIQUES FOR IMPROVED VOLTAGE MEASUREMENTS [J].
NYE, P ;
DINNIS, AR .
SCANNING, 1985, 7 (03) :113-116
[3]  
Ranasinghe D. W., 1983, Microscopy of Semiconducting Materials 1983. 3rd Oxford Conference, P433