DIRECT ELECTRON-MICROSCOPIC IMAGING OF SURFACE-TOPOGRAPHY BY DIFFRACTION AND PHASE-CONTRAST

被引：16

作者：

LEHMPFUHL, G ^{[1
]}

WARBLE, CE ^{[1
]}

机构：

[1] CSIRO,DIV CHEM PHYS,CLAYTON,VIC 3168,AUSTRALIA

来源：

ULTRAMICROSCOPY | 1986年 / 19卷 / 02期

关键词：

D O I：

10.1016/0304-3991(86)90202-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：135 / 146

页数：12

相关论文

共 18 条

[1] BETHGE H, 1960, P EUR REG C ELECTRON, V1, P266
[2] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY
CHERNS, D
[J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (03): : 549 - 556
[3] OBSERVATION OF ATOMIC STEPS OF (111) SURFACE OF A SILICON CRYSTAL USING BRIGHT FIELD ELECTRON-MICROSCOPY
IIJIMA, S
[J]. ULTRAMICROSCOPY, 1981, 6 (01) : 41 - 52
[4] IIJIMA S, 1977, OPTIK, V47, P437
[5] KAMBE K, 1975, OPTIK, V42, P187
[6] IMAGING OF ATOMIC STEPS ON ULTRATHIN AU FILMS BY TEM
KLAUA, M
BETHGE, H
[J]. ULTRAMICROSCOPY, 1983, 11 (2-3) : 125 - 129
[7] ELECTRON-MICROSCOPIC CONTRAST OF ATOMIC STEPS ON FCC METAL CRYSTAL-SURFACES
LEHMPFUHL, G
TAKAYANAGI, K
[J]. ULTRAMICROSCOPY, 1981, 6 (02) : 195 - 200
[8] DARKFIELD AND BRIGHTFIELD TECHNIQUES FOR ELECTRON-MICROSCOPIC OBSERVATION OF ATOMIC STEPS ON MGO SINGLE-CRYSTAL SURFACES
LEHMPFUHL, G
UCHIDA, Y
[J]. ULTRAMICROSCOPY, 1979, 4 (03) : 275 - 282
[9] LEHMPFUHL G, 1980, I PHYSICS C SERIES, V52, P393
[10] N-BEAM LATTICE IMAGES .5. USE OF CHARGE-DENSITY APPROXIMATION IN INTERPRETATION OF LATTICE IMAGES
LYNCH, DF
MOODIE, AF
OKEEFE, MA
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1975, A 31 (MAY1): : 300 - &