EVIDENCE FOR THE LEADING ROLE OF THE STACKING-FAULT TRIANGLE IN THE SI(111)1X-1-]7X7 PHASE-TRANSITION

被引:51
作者
HOSHINO, T [1 ]
KUMAMOTO, K [1 ]
KOKUBUN, K [1 ]
ISHIMARU, T [1 ]
OHDOMARI, I [1 ]
机构
[1] WASEDA UNIV,KAGAMI MEM LAB MAT SCI & TECHNOL,SHINJUKU KU,TOKYO 169,JAPAN
来源
PHYSICAL REVIEW B | 1995年 / 51卷 / 20期
关键词
D O I
10.1103/PhysRevB.51.14594
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In situ scanning-tunneling-microscopy (STM) observations at temperatures up to 600°C provide atomic-scale evidence, demonstrating that the formation of the stacking-fault (SF) half-unit plays the leading role in the growth of 7×7 reconstructed domains of Si(111) surfaces from the 1×1 phase upon supercooling. The concept of the SF leading role accounts for the fact that all of the 7×7 reconstructed areas on Si(111) supercooled surfaces form triangular domains with vertices pointing in 1̄ 1̄2 directions. The STM data suggest that the formation of the SF half-unit involves the construction of dimer chains and corner holes. A similar leading role of the SF half-unit is also deduced to be fundamental for the growth of 5×5 or 9×9 metastable structures. © 1995 The American Physical Society.
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页码:14594 / 14597
页数:4
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